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Proceedings Paper

Analyzing and modeling on coordinate conversion errors of airborne lidar detection data
Author(s): Lifang Jiang; Tian Lan; Yinchao Zhang; Guoqiang Ni
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Paper Abstract

Lidar is an important technology for capturing data of three-dimensional surface information in high-resolution airborne earth observation system. To realize the positioning of airborne lidar targets, the coordinates of the laser footprints have to be converted from laser scan coordinate system to WGS-84 coordinate system. The existence of coordinate conversion errors is sure to affect the earth observation accuracy. This paper realized the coordinate conversion from laser scanning coordinates to WGS-84 coordinates and analyzed the influence of coordinate conversion parameter errors on the accuracy of the targets' three-dimensional coordinates. These errors include the range error, scanning angle errors, attitude angle errors, mounting errors, the GPS dynamic positioning errors and so on. Based on the analysis, the coordinate conversion error model was developed. Monte Carlo Method was applied to simulate the influence of several parameter errors respectively on positioning accuracy. Finally, the relationship between positioning errors and the coordinate conversion parameters was simulated when the values of coordinate conversion parameter errors were constants. These simulation results have reference value on the error compensation of detection data.

Paper Details

Date Published: 24 November 2009
PDF: 12 pages
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751331 (24 November 2009); doi: 10.1117/12.840022
Show Author Affiliations
Lifang Jiang, Beijing Institute of Technology (China)
Tian Lan, Beijing Institute of Technology (China)
Yinchao Zhang, Beijing Institute of Technology (China)
Guoqiang Ni, Beijing Institute of Technology (China)

Published in SPIE Proceedings Vol. 7513:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology
Toru Yoshizawa; Ping Wei; Jesse Zheng, Editor(s)

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