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Proceedings Paper

On the characterization of a random monolayer of particles from coherent optical reflectance
Author(s): F. Alarcón-Oseguera; M. Peña-Gomar; A. García-Valenzuela; F. Castillo; E. Pérez
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Paper Abstract

We present the viability of obtaining the particle size and surface coverage in a monolayer of polystyrene particles adsorbed on a glass surface from optical coherent reflectance data around the critical angle in an internal reflection configuration. We have found that fitting a CSM to optical reflectivity curves in an internal reflection configuration around the critical angle with a dilute random monolayer of particles adsorbed on the surface can in fact provide the particle's radius and surface coverage once the particles are sufficiently large.

Paper Details

Date Published: 4 August 2009
PDF: 8 pages
Proc. SPIE 7386, Photonics North 2009, 738612 (4 August 2009); doi: 10.1117/12.839606
Show Author Affiliations
F. Alarcón-Oseguera, Univ. Autonoma de San Luis Potosí (Mexico)
M. Peña-Gomar, Univ. Michoacana de San Nicolás de Hidalgo (Mexico)
A. García-Valenzuela, Univ. Nacional Autónoma de México (Mexico)
F. Castillo, Univ. Autónoma de San Luis Potosí (Mexico)
E. Pérez, Univ. Autónoma de San Luis Potosí (Mexico)


Published in SPIE Proceedings Vol. 7386:
Photonics North 2009
Réal Vallée, Editor(s)

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