
Proceedings Paper
Adaptive removal of show-through artifacts by histogram analysisFormat | Member Price | Non-Member Price |
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Paper Abstract
When scanning a document that is printed on both sides, the image on the reverse can show through with high luminance.
We propose an adaptive method of removing show-through artifacts based on histogram analysis. Instead of attempting
to measure the physical parameters of the paper and the scanning system, or making multiple scans, we analyze the color
distribution to remove unwanted artifacts, using an image of the front of the document alone. First, we accumulate
histogram information to find the lightness distribution of pixels in the scanned image. Using this data, we set thresholds
on both luminance and chrominance to determine candidate regions of show-through. Finally, we classify these regions
into foreground and background of the image on the front of the paper, and show-through from the back. The
background and show-through regions become candidates for erasure, and they are adaptively updated as the process
proceeds. This approach preserves the chrominance of the image on the front of the papers without introducing artifacts.
It does not make the whole image brighter, which is what happens when a fixed threshold is used to remove show-through.
Paper Details
Date Published: 27 January 2010
PDF: 8 pages
Proc. SPIE 7533, Computational Imaging VIII, 75330N (27 January 2010); doi: 10.1117/12.838723
Published in SPIE Proceedings Vol. 7533:
Computational Imaging VIII
Charles A. Bouman; Ilya Pollak; Patrick J. Wolfe, Editor(s)
PDF: 8 pages
Proc. SPIE 7533, Computational Imaging VIII, 75330N (27 January 2010); doi: 10.1117/12.838723
Show Author Affiliations
Jin-Kyung Hong, SAMSUNG Electronics Co., Ltd. (Korea, Republic of)
Ki-Min Kang, SAMSUNG Electronics Co., Ltd. (Korea, Republic of)
Ki-Min Kang, SAMSUNG Electronics Co., Ltd. (Korea, Republic of)
Sang-Ho Kim, SAMSUNG Electronics Co., Ltd. (Korea, Republic of)
Published in SPIE Proceedings Vol. 7533:
Computational Imaging VIII
Charles A. Bouman; Ilya Pollak; Patrick J. Wolfe, Editor(s)
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