
Proceedings Paper
Feature points detection and tracking based on SIFT combining with KLT methodFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
For feature point detection with variable scale, rotation, variable illumination and variable 3D view port, a feature point
detection and tracking method combining scale invariant feature transform (SIFT) and KLT (Kanade-Lucas-Tomasi) is
proposed in this paper. SIFT feature point detection method is improved and it is used to detect feature points of image,
and then KLT method is used to track the feature points continuously. In order to verify the feasibility of the proposed
method, simulation experiments are carried out in real scene image sequences with different complexity using this
method, better results of detection and tracking are obtained and the obtained feature point is more stable than
conventional method.
Paper Details
Date Published: 1 December 2009
PDF: 10 pages
Proc. SPIE 7506, 2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 75062N (1 December 2009); doi: 10.1117/12.838618
Published in SPIE Proceedings Vol. 7506:
2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
Yongtian Wang; Yunlong Sheng; Kimio Tatsuno, Editor(s)
PDF: 10 pages
Proc. SPIE 7506, 2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 75062N (1 December 2009); doi: 10.1117/12.838618
Show Author Affiliations
Hongbing Wang, Univ. of Electronic Science and Technology of China (China)
Zhenming Peng, Univ. of Electronic Science and Technology of China (China)
Jie Liu, Sonix (Chengdu) Technology Co., Ltd. (China)
Zhenming Peng, Univ. of Electronic Science and Technology of China (China)
Jie Liu, Sonix (Chengdu) Technology Co., Ltd. (China)
Youwang Zheng, Univ. of Electronic Science and Technology of China (China)
Baobing Liao, Univ. of Electronic Science and Technology of China (China)
Yue Wang, Univ. of Electronic Science and Technology of China (China)
Baobing Liao, Univ. of Electronic Science and Technology of China (China)
Yue Wang, Univ. of Electronic Science and Technology of China (China)
Published in SPIE Proceedings Vol. 7506:
2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
Yongtian Wang; Yunlong Sheng; Kimio Tatsuno, Editor(s)
© SPIE. Terms of Use
