
Proceedings Paper
Lens decenter and tilt measurement by interferogramFormat | Member Price | Non-Member Price |
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Paper Abstract
For the recent years, the vigorous development of the electro-optic industry, particularly the digital camera and the
cellular phone camera, has placed a larger and larger demand for the optical devices. Among the optical lens, the
aspherical optical lens plays the key component because the aspherical lens may provide better imaging quality then the
spherical lens does. For the manufacturing reason, the aspherical lens is prone to a decenter or tilt issue with respect to
the optical axes of its two surfaces. To measure decenter and tile error specifically would help to obviate the deficient
lens, but most of the present measuring method can't provide this function. This paper proposed a new method to
specifically measure the decenter and tile of lens by observing the interferogram of each surface. And the corresponding
measuring instrument, which contains interferometer and motion stages, was introduced as well.
Paper Details
Date Published: 25 November 2009
PDF: 5 pages
Proc. SPIE 7506, 2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 75060R (25 November 2009); doi: 10.1117/12.838389
Published in SPIE Proceedings Vol. 7506:
2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
Yongtian Wang; Yunlong Sheng; Kimio Tatsuno, Editor(s)
PDF: 5 pages
Proc. SPIE 7506, 2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 75060R (25 November 2009); doi: 10.1117/12.838389
Show Author Affiliations
Min-Wei Hung, National Applied Research Labs. (Taiwan)
Wen-Hong Wu, National Applied Research Labs. (Taiwan)
Wen-Hong Wu, National Applied Research Labs. (Taiwan)
Kuo-Cheng Huang, National Applied Research Labs. (Taiwan)
Published in SPIE Proceedings Vol. 7506:
2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
Yongtian Wang; Yunlong Sheng; Kimio Tatsuno, Editor(s)
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