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Proceedings Paper

SNR analysis according to the practical factors for Mie-scattering lidar
Author(s): Zongjia Qiu; Siying Chen; Yinchao Zhang; Tian Lan; Yuzhao Wang; Weiguo Kong; Peng Liu; Guoqiang Ni
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Paper Abstract

The effectiveness of the lidar scattering signal can be intuitively reflected by SNR. Thus the effective detection range can be objectively evaluated. Usually by theoretical analyzing the devices of lidar signal detection system, an ideal SNR model of scattering signal can be built. Under these circumstances the theoretical SNR might be an inflated value. For instance, when the detection distance is 20Km the SNR can be up to 20dB. However, in the practical experiment the 10Km's SNR is merely 3dB. From the results, it can be deduced that the effective distance range is far less than the simulation value. Consequently, other practical factors must be considered in SNR analysis for Mie-scattering lidar. In the paper the results of Mie scattering lidar experiment are shown firstly. Then the SNR is calculated through deducting the background noise. The background radiation specific gravity is also presented in this paper. The photomultiplier tubes dark-current is detected. And the effect of all noise components to the SNR is estimated. Meanwhile, some improve measurements to reduce the interference noise are mentioned.

Paper Details

Date Published: 20 November 2009
PDF: 8 pages
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751123 (20 November 2009); doi: 10.1117/12.838220
Show Author Affiliations
Zongjia Qiu, Beijing Institute of Technology (China)
Siying Chen, Beijing Institute of Technology (China)
Yinchao Zhang, Beijing Institute of Technology (China)
Tian Lan, Beijing Institute of Technology (China)
Yuzhao Wang, Beijing Institute of Technology (China)
Weiguo Kong, Beijing Institute of Technology (China)
Peng Liu, Beijing Institute of Technology (China)
Guoqiang Ni, Beijing Institute of Technology (China)

Published in SPIE Proceedings Vol. 7511:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Shenghua Ye; Guangjun Zhang; Jun Ni, Editor(s)

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