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Proceedings Paper

Swept-source full-field optical coherence microscopy
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Paper Abstract

Full-Field Optical Coherence Microscopy (FF-OCM) is a microscopic imaging device based on interferometry. It can produce cross-sectional images of bio-tissue or cell samples at a resolution in the order of a micron. Because it can extract an en-face image directly from the sample, it does not need 2D scanning mechanism, which greatly increases the imaging speed compared to fibre-based OCT systems. However, a controlled translation stage is still required in the reference arm of the interferometer to perform the depth scan. Swept-Source OCT (SS-OCT) technology is the second generation of the OCT systems, which not only removes the mechanical scanning, but also increases the signal / noise ratio of the extracted OCT images. In this paper, we describe the design and implementation of a swept-wavelength source based FF-OCM with 60X magnification; 8 um depth resolution; 4 μm depth resolution; 20 mm working distance and 15 frames / second imaging speed.

Paper Details

Date Published: 4 August 2009
PDF: 6 pages
Proc. SPIE 7386, Photonics North 2009, 738604 (4 August 2009); doi: 10.1117/12.838213
Show Author Affiliations
Shoude Chang, National Research Council Canada (Canada)
Sherif Sherif, Univ. of Manitoba (Canada)
Youxin Mao, National Research Council Canada (Canada)
Costel Flueraru, National Research Council Canada (Canada)

Published in SPIE Proceedings Vol. 7386:
Photonics North 2009
Réal Vallée, Editor(s)

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