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Proceedings Paper

Exposing digital image forgeries by 3D reconstruction technology
Author(s): Yongqiang Wang; Xiaojing Xu; Zhihui Li; Haizhen Liu; Zhigang Li; Wei Huang
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Paper Abstract

Digital images are easy to tamper and edit due to availability of powerful image processing and editing software. Especially, forged images by taking from a picture of scene, because of no manipulation was made after taking, usual methods, such as digital watermarks, statistical correlation technology, can hardly detect the traces of image tampering. According to image forgery characteristics, a method, based on 3D reconstruction technology, which detect the forgeries by discriminating the dimensional relationship of each object appeared on image, is presented in this paper. This detection method includes three steps. In the first step, all the parameters of images were calibrated and each crucial object on image was chosen and matched. In the second step, the 3D coordinates of each object were calculated by bundle adjustment. In final step, the dimensional relationship of each object was analyzed. Experiments were designed to test this detection method; the 3D reconstruction and the forged image 3D reconstruction were computed independently. Test results show that the fabricating character in digital forgeries can be identified intuitively by this method.

Paper Details

Date Published: 24 November 2009
PDF: 4 pages
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751309 (24 November 2009); doi: 10.1117/12.838207
Show Author Affiliations
Yongqiang Wang, Ministry of Public Security (China)
Xiaojing Xu, Ministry of Public Security (China)
Zhihui Li, Ministry of Public Security (China)
Haizhen Liu, Ministry of Public Security (China)
Zhigang Li, Ministry of Public Security (China)
Wei Huang, Ministry of Public Security (China)


Published in SPIE Proceedings Vol. 7513:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology
Toru Yoshizawa; Ping Wei; Jesse Zheng, Editor(s)

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