
Proceedings Paper
A universal denoising algorithm with trilateral filter and impulse detectorFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
In this paper, we introduce a new edge-preserving nonlinear filter for removing the mix of Gaussian and impulse noise.
Built from Prasun Choudhury and Jack Tumblin's trilateral filter, the new algorithm incorporate a local gradient statistic
for detecting corrupted pixels in images with impulse noise and a switching mechanism for smoothing the gradients of
impulse noise samples and the gradients of impulse noise-free samples with different parameters. If the central pixel is
impulse-like and has a high statistical value in gradient domain, the impulsive component of the weight in gradient
bilateral filter is more heavily to suppress large impulses. It smoothes image toward a sharply-bounded, gradient
piecewise-linear approximation which provides stronger noise reduction and better edge-limited smoothing behavior.
Compared to most other spatial domain nonlinear filters, the proposed algorithm consistently yields good results in
removing the mix of Gaussian and impulse noise and more notable edge-limited smoothing behavior. Like the trilateral
filter, the proposed algorithm easily extends to N-dimensional signals.
Paper Details
Date Published: 24 November 2009
PDF: 10 pages
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75132C (24 November 2009); doi: 10.1117/12.838118
Published in SPIE Proceedings Vol. 7513:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology
Toru Yoshizawa; Ping Wei; Jesse Zheng, Editor(s)
PDF: 10 pages
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75132C (24 November 2009); doi: 10.1117/12.838118
Show Author Affiliations
Ying-hui Liu, Beijing Institute of Technology (China)
Kun Gao, Beijing Institute of Technology (China)
Kun Gao, Beijing Institute of Technology (China)
Guo-qiang Ni, Beijing Institute of Technology (China)
Shu-Le Ge, Beijing Institute of Technology (China)
Shu-Le Ge, Beijing Institute of Technology (China)
Published in SPIE Proceedings Vol. 7513:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology
Toru Yoshizawa; Ping Wei; Jesse Zheng, Editor(s)
© SPIE. Terms of Use
