Proceedings Paper
Laser beam collimation testing with defocus grating| Format | Member Price | Non-Member Price |
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Paper Abstract
A novel method for testing the collimation of laser beam with defocus grating is presented. Defocus grating
combined with lens of short focus length allows simultaneous imaging of two defocused spots in the ±1 diffraction order
spot. When the well collimated beam passes through the defocus grating, the diameter of the ±1 diffraction order spot is
equal to each other. The relationship between the collimation of the incident beam and diameters of the ±1 diffraction
order spots are analyzed in detail. The position of the pinhole and pointing errors of the collimation system can be
detected by the defocus grating. The feasibility of this method is verified experimentally on the collimation of the He-Ne
laser. The method which has a simple data processing algorithm does not require any referencing or fringe analysis and
can be implemented full-optically.
Paper Details
Date Published: 25 November 2009
PDF: 8 pages
Proc. SPIE 7506, 2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 75060U (25 November 2009); doi: 10.1117/12.838072
Published in SPIE Proceedings Vol. 7506:
2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
Yongtian Wang; Yunlong Sheng; Kimio Tatsuno, Editor(s)
PDF: 8 pages
Proc. SPIE 7506, 2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 75060U (25 November 2009); doi: 10.1117/12.838072
Show Author Affiliations
Haotong Ma, National Univ. of Defense Technology (China)
Fengjie Xi, National Univ. of Defense Technology (China)
Pu Zhou, National Univ. of Defense Technology (China)
Xiaolin Wang, National Univ. of Defense Technology (China)
Fengjie Xi, National Univ. of Defense Technology (China)
Pu Zhou, National Univ. of Defense Technology (China)
Xiaolin Wang, National Univ. of Defense Technology (China)
Yanxing Ma, National Univ. of Defense Technology (China)
Xiaojun Xu, National Univ. of Defense Technology (China)
Zejin Liu, National Univ. of Defense Technology (China)
Xiaojun Xu, National Univ. of Defense Technology (China)
Zejin Liu, National Univ. of Defense Technology (China)
Published in SPIE Proceedings Vol. 7506:
2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
Yongtian Wang; Yunlong Sheng; Kimio Tatsuno, Editor(s)
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