
Proceedings Paper
Study on laser backscattering of cone-shaped objectsFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
With the physical optics method, the laser backscattering property of a cone-shaped object is introduced in this paper.
First, the far field scattering amplitude of a rough surface illuminated by a plane light wave is deduced with the
Kirchhoff approximation. The stationary phase method is employed to deal with some complicated integral factor.
Finally, analytical form of a laser scattering intensity is derived for a cone-shaped object. To verify this model, the far
backscattering intensity distribution is calculated and analyzed with its conic angle and surface roughness. These results
show that the far backscattering intensity of cone-shaped objects is related with conic angle, its surface roughness and
light wavelength.
Paper Details
Date Published: 24 November 2009
PDF: 7 pages
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751329 (24 November 2009); doi: 10.1117/12.838069
Published in SPIE Proceedings Vol. 7513:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology
Toru Yoshizawa; Ping Wei; Jesse Zheng, Editor(s)
PDF: 7 pages
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751329 (24 November 2009); doi: 10.1117/12.838069
Show Author Affiliations
Chunping Yang, Univ. of Electronic Science and Technology of China (China)
Meilin Kang, Univ. of Electronic Science and Technology of China (China)
Meilin Kang, Univ. of Electronic Science and Technology of China (China)
Chunyan Zhen, Univ. of Electronic Science and Technology of China (China)
Jian Wu, Univ. of Electronic Science and Technology of China (China)
Jian Wu, Univ. of Electronic Science and Technology of China (China)
Published in SPIE Proceedings Vol. 7513:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology
Toru Yoshizawa; Ping Wei; Jesse Zheng, Editor(s)
© SPIE. Terms of Use
