Share Email Print
cover

Proceedings Paper

Lifting wavelet method of target detection
Author(s): Jun Han; Chi Zhang; Xu Jiang; Fang Wang; Jin Zhang
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Image target recognition plays a very important role in the areas of scientific exploration, aeronautics and space-to-ground observation, photography and topographic mapping. Complex environment of the image noise, fuzzy, all kinds of interference has always been to affect the stability of recognition algorithm. In this paper, the existence of target detection in real-time, accuracy problems, as well as anti-interference ability, using lifting wavelet image target detection methods. First of all, the use of histogram equalization, the goal difference method to obtain the region, on the basis of adaptive threshold and mathematical morphology operations to deal with the elimination of the background error. Secondly, the use of multi-channel wavelet filter wavelet transform of the original image de-noising and enhancement, to overcome the general algorithm of the noise caused by the sensitive issue of reducing the rate of miscarriage of justice will be the multi-resolution characteristics of wavelet and promotion of the framework can be designed directly in the benefits of space-time region used in target detection, feature extraction of targets. The experimental results show that the design of lifting wavelet has solved the movement of the target due to the complexity of the context of the difficulties caused by testing, which can effectively suppress noise, and improve the efficiency and speed of detection.

Paper Details

Date Published: 24 November 2009
PDF: 10 pages
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751323 (24 November 2009); doi: 10.1117/12.838013
Show Author Affiliations
Jun Han, Xi'an Technological Univ. (China)
Chi Zhang, Xi'an Technological Univ. (China)
Xu Jiang, Xi'an Institute of Applied Optics (China)
Fang Wang, Xi'an Institute of Applied Optics (China)
Jin Zhang, Xi'an Technological Univ. (China)


Published in SPIE Proceedings Vol. 7513:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology
Toru Yoshizawa; Ping Wei; Jesse Zheng, Editor(s)

© SPIE. Terms of Use
Back to Top