
Proceedings Paper
Micro-structure imaging and measurement based on digital holographic systemFormat | Member Price | Non-Member Price |
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Paper Abstract
Based on the phase reconstruction method which is combined digital holography (DH) with digital lateral shearing
interferometry (LSI) and the idea of the automatic aberration compensation (AAC), a method to eliminate the linear term
of the sheared phase map is proposed. The procedures for reconstruction phase image using the LSI-DH method have
been analyzed in detail, which indicates that one-dimensional phase unwrapping must be applied to the original phase
map before lateral shearing. Moreover, the condition to obtain correct phase image is that the phase difference between
the two adjacent pixels of the shearogram map is less than 2π. One of the prominent advantages of this method is that
when the small amount of shearing is applied the two-dimensional phase unwrapping can be avoided. The computer
simulations, which are based on the lensless Fourier transform holographic system, demonstrate the validity of the
proposed method. It also indicates that the method has large tolerance to noise.
Paper Details
Date Published: 24 November 2009
PDF: 6 pages
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131Y (24 November 2009); doi: 10.1117/12.838004
Published in SPIE Proceedings Vol. 7513:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology
Toru Yoshizawa; Ping Wei; Jesse Zheng, Editor(s)
PDF: 6 pages
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131Y (24 November 2009); doi: 10.1117/12.838004
Show Author Affiliations
Baoqun Zhao, Hebei Univ. of Engineering (China)
Published in SPIE Proceedings Vol. 7513:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology
Toru Yoshizawa; Ping Wei; Jesse Zheng, Editor(s)
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