
Proceedings Paper
Research on scene-based Narcissus correction algorithm in infrared focal plane arraysFormat | Member Price | Non-Member Price |
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Paper Abstract
Cooled infrared focal plane array (Cooled IRFPA) has been applied widely in military and civil fields. In the cooled
focal plane array detector infrared imaging systems, narcissus as a unique defect has a degenerate effect on the image
quality of cooled infrared imaging systems, such as blocky, annular or "corner heat" fixed pattern noise in infrared
images. Therefore, the correction of narcissus effect using image processing method is important to infrared imaging
systems. Through analyzing manifestation of narcissus effect by statistical approach, a cooled infrared imaging system
model considering narcissus effect is established, by which a self-adaptive narcissus correction algorithm based on scene
statistic and radial compute is presented. From the simulation and the experiment on an actual cooled IRFPA module,
this algorithm is proved very effective on correcting narcissus effect and improving image quality. Moreover, the peak
signal to noise ratio (PSNR) also increases obviously.
Paper Details
Date Published: 24 November 2009
PDF: 10 pages
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131S (24 November 2009); doi: 10.1117/12.837890
Published in SPIE Proceedings Vol. 7513:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology
Toru Yoshizawa; Ping Wei; Jesse Zheng, Editor(s)
PDF: 10 pages
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131S (24 November 2009); doi: 10.1117/12.837890
Show Author Affiliations
Yang Cao, Beijing Institute of Technology (China)
Wei-qi Jin, Beijing Institute of Technology (China)
Chong-liang Liu, Beijing Institute of Technology (China)
Wei-qi Jin, Beijing Institute of Technology (China)
Chong-liang Liu, Beijing Institute of Technology (China)
Xiu Liu, Beijing Institute of Technology (China)
Fu-wen Li, Beijing Institute of Technology (China)
Wei-li Chen, Beijing Institute of Technology (China)
Fu-wen Li, Beijing Institute of Technology (China)
Wei-li Chen, Beijing Institute of Technology (China)
Published in SPIE Proceedings Vol. 7513:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology
Toru Yoshizawa; Ping Wei; Jesse Zheng, Editor(s)
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