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Proceedings Paper

Online image acquisition system of magnet chip surface quality based on asynchronous reset
Author(s): Kaihua Wu; Zhengjie Li; Shaopeng Hu
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Paper Abstract

Magnet chip is a kind of industrial work piece widely used in electronic equipment. Manual examination is still the main method for its surface quality test and cannot meet the demand of high efficiency and accuracy. A universal online image acquisition method was proposed based on asynchronous reset of CCD. The fast trigger, precision placement, movement blur and image definition were resolved. (1)A focused optical fiber was used in optoelectronic sensor to generate trigger signal timely when work piece moved through the little optical spot. (2)Precision hardware time-delay and asynchronous reset pulse generation circuits were designed. The image was acquired only when work piece moved into the designed position. (3) The image acquisition was fulfilled by hardware interrupt mode. The maximal processing time could be designed to ensure the normal acquiring flow. (4) Quantitative relation between position accuracy and speed, time-delay error, CCD resolution and imaging region was deuced. Relation between moving blur and speed, exposure time was also decided. (5)The entire time sequence of asynchronous reset was designed. (6) Testing system was designed. The position accuracy achieved 0.1mm when moving speed reached 100mm/s. Moving blur was limited in less one pixel size. Experiments showed the system can meet the demand of real and online measurement of magnet chip surface quality.

Paper Details

Date Published: 20 November 2009
PDF: 5 pages
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111G (20 November 2009); doi: 10.1117/12.837858
Show Author Affiliations
Kaihua Wu, Hangzhou Dianzi Univ. (China)
Zhengjie Li, Hangzhou Dianzi Univ. (China)
Shaopeng Hu, Hangzhou Dianzi Univ. (China)


Published in SPIE Proceedings Vol. 7511:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Shenghua Ye; Guangjun Zhang; Jun Ni, Editor(s)

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