Proceedings Paper
Simulation of ultraviolet laser-induced fluorescence LIDAR for detecting bioaerosol| Format | Member Price | Non-Member Price |
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Paper Abstract
The biological warfare agent (BWA) is a kind of terrible threat during the war or raid from the terrorist. Last decade, the
interest in utilizing ultraviolet laser-induced fluorescence (UV-LIF) LIDAR to detect the bioaerosol cloud has risen in
order to measure the distribution of the bioaerosol particle. The UV-LIF LIDAR system can remotely detect and classify
the bioaerosol agents and it is an active detecting system. As the infrared absorbing in the atmosphere is less, the range
of infrared remote sensing is very far. The infrared laser at 1064 nm wavelength firstly begins to work in the UV-LIF
LIDAR system and the aerosol cloud can be detected at very long range through the elastic backscattering signal from
aerosol irradiated by infrared laser. But the category of aerosol can't be identified yet. If the infrared elastic
backscattering level exceeds a threshold, UV laser at 355 nm wavelength will be triggered and induce the fluorescence.
The excitated spectra of fluorescence can be used for discrimination of different aerosol species and particle
concentration. This paper put forward for a UV-LIF LIDAR system model and the principle of the model is described
summarily. Then the system parameters are presented and the simulation and analysis of the infrared elastic
backscattering and laser-induced fluorescence are made, which is based on these parameters. Raman backscattering
signal of Nitrogen gas in the atmosphere generally is taken to reduce measuring error, so the article also simulates this
Raman backscatter signal at 387 nm wavelength. The studies above may provide some valuable instructions to the design
of a real UV-LIF LIDAR system.
Paper Details
Date Published: 20 November 2009
PDF: 9 pages
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111C (20 November 2009); doi: 10.1117/12.837805
Published in SPIE Proceedings Vol. 7511:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Shenghua Ye; Guangjun Zhang; Jun Ni, Editor(s)
PDF: 9 pages
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111C (20 November 2009); doi: 10.1117/12.837805
Show Author Affiliations
Peng Liu, Beijing Institute of Technology (China)
Yinchao Zhang, Beijing Institute of Technology (China)
Siying Chen, Beijing Institute of Technology (China)
Tian Lan, Beijing Institute of Technology (China)
Yinchao Zhang, Beijing Institute of Technology (China)
Siying Chen, Beijing Institute of Technology (China)
Tian Lan, Beijing Institute of Technology (China)
Yuzhao Wang, Beijing Institute of Technology (China)
Zongjia Qiu, Beijing Institute of Technology (China)
Weiguo Kong, Beijing Institute of Technology (China)
Guoqiang Ni, Beijing Institute of Technology (China)
Zongjia Qiu, Beijing Institute of Technology (China)
Weiguo Kong, Beijing Institute of Technology (China)
Guoqiang Ni, Beijing Institute of Technology (China)
Published in SPIE Proceedings Vol. 7511:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Shenghua Ye; Guangjun Zhang; Jun Ni, Editor(s)
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