
Proceedings Paper
Color sorting algorithm based on K-means clustering algorithmFormat | Member Price | Non-Member Price |
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Paper Abstract
In the process of raisin production, there were a variety of color impurities, which needs be removed effectively. A
new kind of efficient raisin color-sorting algorithm was presented here. First, the technology of image processing basing
on the threshold was applied for the image pre-processing, and then the gray-scale distribution characteristic of the raisin
image was found. In order to get the chromatic aberration image and reduce some disturbance, we made the flame image
subtraction that the target image data minus the background image data. Second, Haar wavelet filter was used to get the
smooth image of raisins. According to the different colors and mildew, spots and other external features, the calculation
was made to identify the characteristics of their images, to enable them to fully reflect the quality differences between
the raisins of different types. After the processing above, the image were analyzed by K-means clustering analysis
method, which can achieve the adaptive extraction of the statistic features, in accordance with which, the image data
were divided into different categories, thereby the categories of abnormal colors were distinct. By the use of this
algorithm, the raisins of abnormal colors and ones with mottles were eliminated. The sorting rate was up to 98.6%, and
the ratio of normal raisins to sorted grains was less than one eighth.
Paper Details
Date Published: 24 November 2009
PDF: 9 pages
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131F (24 November 2009); doi: 10.1117/12.837748
Published in SPIE Proceedings Vol. 7513:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology
Toru Yoshizawa; Ping Wei; Jesse Zheng, Editor(s)
PDF: 9 pages
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131F (24 November 2009); doi: 10.1117/12.837748
Show Author Affiliations
BaoFeng Zhang, Tianjin Univ. of Technology (China)
Qian Huang, Tianjin Univ. of Technology (China)
Published in SPIE Proceedings Vol. 7513:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology
Toru Yoshizawa; Ping Wei; Jesse Zheng, Editor(s)
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