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Proceedings Paper

Active infrared thermal imaging technology to detect the corrosion defects in aircraft cargo door
Author(s): Dapeng Chen; Cunlin Zhang; Zhi Zeng; Chunfei Xing; Yanhong Li
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Paper Abstract

Aircraft fuselage material corrosion problems have been major aviation security issues, which hinder the development of aviation industry. How can we use non-destructive testing methods to detect the internal corrosion defects from the outside of the fuselage, to find the hidden safety problems in advance and update the defective equipment and materials, has great significance for the prevention of accidents. Nowadays, the active infrared thermal imaging technology as a new nondestructive technology has been gradually used on a wide variety of materials, such as composite, metal and so on. This article makes use of this technology on an aircraft cargo door specimen to detect the corrosion defects. Firstly, use High-energy flash pulse to excite the specimen, and use the thermal image processing software to splice the thermal images, so the thermal images of the overall specimen can be showed. Then, heat the defects by ultrasonic excitation, this will cause vibration and friction or thermoelastic effects in the places of defects, so the ultrasonic energy will dissipate into heat and manifested in the uneven temperature of surface. An Infrared camera to capture the changes of temperature of material surface, send data to the computer and records the thermal information of the defects. Finally, extracting data and drawing infrared radiation-time curve of some selected points of interest to analyze the signal changes in heat of defects further more. The results of the experiments show that both of the two ways of heat excitation show a clear position and shape of defects, and the ultrasonic method has more obvious effect of excitation to the defects, and a higher signal to noise ratio than the flash pulse excitation, but flash pulse method do not contact the specimen in the process of excitation, and shows the location and shape of defects in the overall of the specimen has its advantages.

Paper Details

Date Published: 18 November 2009
PDF: 9 pages
Proc. SPIE 7512, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Information Security, 751206 (18 November 2009); doi: 10.1117/12.837743
Show Author Affiliations
Dapeng Chen, Beijing Univ. of Aeronautics and Astronautics (China)
Cunlin Zhang, Capital Normal Univ. (China)
Zhi Zeng, Chongqing Normal Univ. (China)
Chunfei Xing, Capital Normal Univ. (China)
Yanhong Li, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 7512:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Information Security
Cunlin Zhang; Tiegen Liu, Editor(s)

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