
Proceedings Paper
A numerical tool for analyzing light propagation in photonic-crystal waveguides in the presence of fabrication imperfectionsFormat | Member Price | Non-Member Price |
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Paper Abstract
As they are compatible with on-chip integration, photonic-crystal (PhC) devices operating with slow light represent a
promising solution for time-domain processing of optical signals. However, the slow-light transport is strongly impacted
by random fabrication fluctuations, such as variations in hole sizes, shapes or locations, and since disorder is regarded as
critical in practice, there has been significant effort to determine the induced extrinsic losses. Our current understanding
of how does light actually propagate in real photonic-crystal waveguides (PhCWs) relies on perturbation approaches.
Although intuitively sound, the latter are only valid in the weak-scattering regime, where the structural imperfections
hardly affect the light propagation. Here we introduce a new Bloch mode scattering formalism that overcomes the
present limitations of perturbation approaches, since it takes into account the inevitable multiple-scattering that leads to
Anderson's localization in such waveguides.
Paper Details
Date Published: 22 January 2010
PDF: 9 pages
Proc. SPIE 7608, Quantum Sensing and Nanophotonic Devices VII, 76080Q (22 January 2010); doi: 10.1117/12.837704
Published in SPIE Proceedings Vol. 7608:
Quantum Sensing and Nanophotonic Devices VII
Manijeh Razeghi; Rengarajan Sudharsanan; Gail J. Brown, Editor(s)
PDF: 9 pages
Proc. SPIE 7608, Quantum Sensing and Nanophotonic Devices VII, 76080Q (22 January 2010); doi: 10.1117/12.837704
Show Author Affiliations
S. Mazoyer, Institut d'Optique, CNRS, Univ. Paris-Sud (France)
J. P. Hugonin, Institut d'Optique, CNRS, Univ. Paris-Sud (France)
J. P. Hugonin, Institut d'Optique, CNRS, Univ. Paris-Sud (France)
P. Lalanne, Institut d'Optique, CNRS, Univ. Paris-Sud (France)
Published in SPIE Proceedings Vol. 7608:
Quantum Sensing and Nanophotonic Devices VII
Manijeh Razeghi; Rengarajan Sudharsanan; Gail J. Brown, Editor(s)
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