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Proceedings Paper

Distortion measurement of push-broom imaging spectrometer
Author(s): Yuheng Chen; Yiqun Ji; Jiankang Zhou; Xinhua Chen; XiaoXiao Wei; Weimin Shen
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Paper Abstract

The requirement for low distortion in either spatial or spectral direction of a push-broom imaging spectrometer has been recently recognized. Though distortion scale of as much as 1 or 2 pixels have been accepted in previous spectrometer designs, it is suggested to be limited to the order of hundredth of a pixel to preserve the validity and integrity of the spectral imaging data. The developed push-broom imaging spectrometer adopts a reflective Offner relay structure and provides good optical correction and compact size. The spectral and spatial distortion measurement is of significance for instrument performance evaluation and alignment guidance. In this paper, two easy-to-implement and effective measurement methods for both spatial and spectral distortion are presented. By using a standard Hg-Cd lamp as both the illuminating source and the object, the spectroscopic image of the slit focusing onto the CCD focal plane is collected. In certain rows of the image, the center positions of every spectral line are recorded. Through the comparison of recorded positions of different rows, the spectral line bending of the calibrated imaging spectrometer is worked out. In the continuous spectrum illumination condition and by using a self-made mask as the object, the entrance slit image is cut into tens of tiny rows that correspond to different image heights. The center positions of 5 typical rows are calculated and five chromatic distortion curves are worked out with certain interpolation method.

Paper Details

Date Published: 30 November 2009
PDF: 9 pages
Proc. SPIE 7506, 2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 750621 (30 November 2009); doi: 10.1117/12.837677
Show Author Affiliations
Yuheng Chen, Soochow Univ. (China)
Yiqun Ji, Soochow Univ. (China)
Jiankang Zhou, Soochow Univ. (China)
Xinhua Chen, Soochow Univ. (China)
XiaoXiao Wei, Soochow Univ. (China)
Weimin Shen, Soochow Univ. (China)

Published in SPIE Proceedings Vol. 7506:
2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
Yongtian Wang; Yunlong Sheng; Kimio Tatsuno, Editor(s)

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