
Proceedings Paper
Detection technique of targets for missile defense systemFormat | Member Price | Non-Member Price |
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Paper Abstract
Ballistic missile defense system (BMDS) is a weapon system for intercepting enemy ballistic missiles. It includes
ballistic-missile warning system, target discrimination system, anti-ballistic-missile guidance systems, and
command-control communication system. Infrared imaging detection and laser imaging detection are widely used in
BMDS for surveillance, target detection, target tracking, and target discrimination. Based on a comprehensive review of
the application of target-detection techniques in the missile defense system, including infrared focal plane arrays
(IRFPA), ground-based radar detection technology, 3-dimensional imaging laser radar with a photon counting avalanche
photodiode (APD) arrays and microchip laser, this paper focuses on the infrared and laser imaging detection techniques
in missile defense system, as well as the trends for their future development.
Paper Details
Date Published: 24 November 2009
PDF: 8 pages
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751318 (24 November 2009); doi: 10.1117/12.837672
Published in SPIE Proceedings Vol. 7513:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology
Toru Yoshizawa; Ping Wei; Jesse Zheng, Editor(s)
PDF: 8 pages
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751318 (24 November 2009); doi: 10.1117/12.837672
Show Author Affiliations
Hua-ling Guo, Beijing Institute of Technology (China)
North Univ. of China (China)
Jia-hao Deng, Beijing Institute of Technology (China)
North Univ. of China (China)
Jia-hao Deng, Beijing Institute of Technology (China)
Ke-rong Cai, Beijing Institute of Technology (China)
Published in SPIE Proceedings Vol. 7513:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology
Toru Yoshizawa; Ping Wei; Jesse Zheng, Editor(s)
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