
Proceedings Paper
Two-wavelength moiré deflection tomography in studying the dispersive characteristic for flame flow fieldsFormat | Member Price | Non-Member Price |
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Paper Abstract
In this paper, the dispersive characteristic of flame flow fields is studied. Two-wavelength moire; deflection tomography is introduced to verify the dispersive characteristic for flame flow field, while 532nm and 808nm are chosen as the probe wavelengths. The combustion of propane in air is chosen as a practical example for theoretical and experimental investigation. The theories manifest that the dispersive capability of flame is determined by temperature, pressure, components as well as the probe
wavelength, and the contribution of an electron which is one of the components of flame to the refractive index is nearly 102 or 103 times that of a neutral particle in the given wavelength region. In short, the theoretical analysis and discussion match well with the experimental results.
Paper Details
Date Published: 24 November 2009
PDF: 10 pages
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751313 (24 November 2009); doi: 10.1117/12.837439
Published in SPIE Proceedings Vol. 7513:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology
Toru Yoshizawa; Ping Wei; Jesse Zheng, Editor(s)
PDF: 10 pages
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751313 (24 November 2009); doi: 10.1117/12.837439
Show Author Affiliations
Yun-yun Chen, Nanjing Univ. of Science and Technology (China)
Yang Song, Nanjing Univ. of Science and Technology (China)
Yang Song, Nanjing Univ. of Science and Technology (China)
An-zhi He, Nanjing Univ. of Science and Technology (China)
Zhen-hua Li, Nanjing Univ. of Science and Technology (China)
Zhen-hua Li, Nanjing Univ. of Science and Technology (China)
Published in SPIE Proceedings Vol. 7513:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology
Toru Yoshizawa; Ping Wei; Jesse Zheng, Editor(s)
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