
Proceedings Paper
Imaging system to measure kinetics of material cluster ejection during exit-surface damage initiation and growth in fused silicaFormat | Member Price | Non-Member Price |
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Paper Abstract
Laser-induced damage on the surface of optical components typically is manifested by the formation of microscopic
craters that can ultimately degrade the optics performance characteristics. It is believed that the damage process is the
result of the material exposure to high temperatures and pressures within a volume on the order of several cubic microns
located just below the surface. The response of the material following initial localized energy deposition by the laser
pulse, including the timeline of events and the individual processes involved during this timeline, is still largely
unknown. In this work we introduce a time-resolved microscope system designed to enable a detailed investigation of
the sequence of dynamic events involved during surface damage. To best capture individual aspects of the damage
timeline, this system is employed in multiple imaging configurations (such as multi-view image acquisition at a single
time point and multi-image acquisition at different time points of the same event) and offers sensitivity to phenomena at
very early delay times. The capabilities of this system are demonstrated with preliminary results from the study of exitsurface
damage in fused silica. The time-resolved images provide information on the material response immediately
following laser energy deposition, the processes later involved during crater formation or growth, the material ejecta
kinetics, and overall material motion and transformation. Such results offer insight into the mechanisms governing
damage initiation and growth in the optical components of ICF class laser systems.
Paper Details
Date Published: 31 December 2009
PDF: 11 pages
Proc. SPIE 7504, Laser-Induced Damage in Optical Materials: 2009, 750418 (31 December 2009); doi: 10.1117/12.836922
Published in SPIE Proceedings Vol. 7504:
Laser-Induced Damage in Optical Materials: 2009
Gregory J. Exarhos; Vitaly E. Gruzdev; Detlev Ristau; M. J. Soileau; Christopher J. Stolz, Editor(s)
PDF: 11 pages
Proc. SPIE 7504, Laser-Induced Damage in Optical Materials: 2009, 750418 (31 December 2009); doi: 10.1117/12.836922
Show Author Affiliations
Rajesh N. Raman, Lawrence Livermore National Lab. (United States)
Raluca A. Negres, Lawrence Livermore National Lab. (United States)
Raluca A. Negres, Lawrence Livermore National Lab. (United States)
Stavros G. Demos, Lawrence Livermore National Lab. (United States)
Published in SPIE Proceedings Vol. 7504:
Laser-Induced Damage in Optical Materials: 2009
Gregory J. Exarhos; Vitaly E. Gruzdev; Detlev Ristau; M. J. Soileau; Christopher J. Stolz, Editor(s)
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