Share Email Print

Proceedings Paper

Analysis in wavelength dependence of electronic damage
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Many investigations in laser induced damage thresholds (LIDT) have shown a very deterministic behavior for the ultra short pulse regime. From the current understanding, femtosecond laser damage is driven by electronic photon-matter interaction. This process can be theoretically described by photo-, and avalanche-ionization and the respective relaxation processes. On the basis of a wavelength dependency of the laser-induced damage threshold of titania, a dominant influence of multi-photon absorption (MPI) on the damage behavior could be demonstrated. This particular characteristic could be observed in a stepwise increase of the LIDT in the transition ranges of the orders of multi-photon absorption. This paper presents an analysis of the wavelength dependence of femtosecond LIDT with different theoretic models and a comparison of simulated data with the measured wavelength dependence of titania. Both, the wavelength position and the quantitative change of the laser power resistance in the range of the n to the n+1 photon absorption are calculated in a theoretical analysis. Additionally, the influence of different microstructures of titania on the quantized MPIcharacteristic is investigated.

Paper Details

Date Published: 31 December 2009
PDF: 12 pages
Proc. SPIE 7504, Laser-Induced Damage in Optical Materials: 2009, 75040N (31 December 2009); doi: 10.1117/12.836701
Show Author Affiliations
M. Jupé, Laser Zentrum Hannover e.V. (Germany)
L. Jensen, Laser Zentrum Hannover e.V. (Germany)
K. Starke, Laser Zentrum Hannover e.V. (Germany)
D. Ristau, Laser Zentrum Hannover e.V. (Germany)
A. Melninkaitis, Vilnius Univ. (Lithuania)
V. Sirutkaitis, Vilnius Univ. (Lithuania)

Published in SPIE Proceedings Vol. 7504:
Laser-Induced Damage in Optical Materials: 2009
Gregory J. Exarhos; Vitaly E. Gruzdev; Detlev Ristau; M. J. Soileau; Christopher J. Stolz, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?