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Proceedings Paper

Nonlinear analysis for image stabilization in IR imaging system
Author(s): Zhan-lei Xie; Jin Lu; Yong-hong Luo; Mei-sheng Zhang
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Paper Abstract

In order to acquire stabilization image for IR imaging system, an image stabilization system is required. Linear method is often used in current research on the system and a simple PID controller can meet the demands of common users. In fact, image stabilization system is a structure with nonlinear characters such as structural errors, friction and disturbances. In up-grade IR imaging system, although conventional PID controller is optimally designed, it cannot meet the demands of higher accuracy and fast responding speed when disturbances are present. To get high-quality stabilization image, nonlinear characters should be rejected. The friction and gear clearance are key factors and play an important role in the image stabilization system. The friction induces static error of system. When the system runs at low speed, stick-slip and creeping induced by friction not only decrease resolution and repeating accuracy, but also increase the tracking error and the steady state error. The accuracy of the system is also limited by gear clearance, and selfexcited vibration is brought on by serious clearance. In this paper, effects of different nonlinear on image stabilization precision are analyzed, including friction and gear clearance. After analyzing the characters and influence principle of the friction and gear clearance, a friction model is established with MATLAB Simulink toolbox, which is composed of static friction, Coulomb friction and viscous friction, and the gear clearance non-linearity model is built, providing theoretical basis for the future engineering practice.

Paper Details

Date Published: 4 August 2009
PDF: 6 pages
Proc. SPIE 7383, International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications, 738331 (4 August 2009); doi: 10.1117/12.836341
Show Author Affiliations
Zhan-lei Xie, Tianjin Jinhang Institute of Technical Physics (China)
Jin Lu, Tianjin Jinhang Institute of Technical Physics (China)
Yong-hong Luo, Tianjin Jinhang Institute of Technical Physics (China)
Mei-sheng Zhang, Tianjin Jinhang Institute of Technical Physics (China)


Published in SPIE Proceedings Vol. 7383:
International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications
Jeffery Puschell; Hai-mei Gong; Yi Cai; Jin Lu; Jin-dong Fei, Editor(s)

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