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Proceedings Paper

Experimental measurement for the degree of athermalization of IR optical systems
Author(s): Shouqian Chen; Zhigang Fan; Hong Chang
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Paper Abstract

In this paper an experimental measurement system was carried out in order to estimate the degree of athermalization of the infrared optical systems, the test system could evaluate the change of focus and imaging quantity with environment temperature in three spectrum range(1~3μm, 3~5μm and 8~12μm) respectively. The infinite target was gained by the high temperature blackbody with some particular target and the collimator, and then was focused on the focal plane of the IR optical system under test, whilst a medial-image of the infinite target was obtained. The medial-image was magnified through the IR micro objective and then focused on the imaging detector arrays, the images in the different temperature conditions were analyzed through the aspects of autofocus algorithms and image processing to assess the change of focus and imaging quantity. A thermal equipment with two standard ZnS windows was designed to simulate the circumstance temperature from -55°C to +80°C; two IR micro objective were used to capture the medial-images; the grating ruler with 3μm absolute measurement accuracy was used as the feedback of defocus value. Finally, a test results of some MWIR was given through the change of focus, image size and energy distribution in different circumstance temperature.

Paper Details

Date Published: 4 August 2009
PDF: 8 pages
Proc. SPIE 7383, International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications, 73830D (4 August 2009); doi: 10.1117/12.835940
Show Author Affiliations
Shouqian Chen, Harbin Institute of Technology (China)
Zhigang Fan, Harbin Institute of Technology (China)
Hong Chang, Harbin Institute of Technology (China)

Published in SPIE Proceedings Vol. 7383:
International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications
Jeffery Puschell; Hai-mei Gong; Yi Cai; Jin Lu; Jin-dong Fei, Editor(s)

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