Share Email Print

Proceedings Paper

A wavelet-based quality measure for evaluating the degradation of pan-sharpened images due to local contrast inversion
Author(s): Vladimir Buntilov
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Pan-sharpened images can effectively be used in various remote sensing applications. During recent years a vast number of pan-sharpening algorithms has been proposed. Thus, the evaluation of their performance became a vital issue. The quality assessment of pan-sharpened images is complicated by the absence of reference data, the ideal image what the multispectral scanner would observe if it had as high spatial resolution as the panchromatic instrument. This paper presents a novel method to evaluate the degree of local quality degradation in pansharpened images, which is the result of contrast inversion of the fusing bands. The proposed method does not require a reference image. Firstly, the algorithm identifies the areas in which the contrast inversion may be confidently detected. Then, based on the found spatial consistency violations, the quantitative degradation index is calculated for the fused product. The proposed approach was validated with the use of very high resolution optical imagery. The experiments have shown that the proposed measure objectively reflects local quality deterioration of pan-sharpened images.

Paper Details

Date Published: 18 January 2010
PDF: 10 pages
Proc. SPIE 7529, Image Quality and System Performance VII, 75290P (18 January 2010); doi: 10.1117/12.835513
Show Author Affiliations
Vladimir Buntilov, Mahidol Univ. (Thailand)

Published in SPIE Proceedings Vol. 7529:
Image Quality and System Performance VII
Susan P. Farnand; Frans Gaykema, Editor(s)

© SPIE. Terms of Use
Back to Top