In this work, we present some practical methods for analyzing and processing the TEM (transmission electron microscope) images with Matlab, among which including "adjusting the images", "adumbrating the units", "filtering the noise in the images", and so on. To improve the resolution of the TEM pictures, we use form boards to process the elements in the input pictures. The form boards are set up according to the characteristics of the input TEM images. In order to measure the dimension of the nanocrystal more precisely, we distinguish the points with larger changes in grey level by using the function "edge" to get the structure information of the images. To make the morphology of the crystals more clearly, we adjust the images by mapping the brightness of the original patterns to a new range of value, which can be realized with the function "imadjust". To obtain the brightness distribution in the images can help us analyzing the dispersive property of the nanocrystals. The brightness distribution in the patterns can be obtained with the function "improfile", which computes the intensity values in the image by using interpolation arithmetic.

Date Published: 6 August 2009
PDF: 6 pages
Proc. SPIE 7384, International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Imaging Detectors and Applications, 73840K (6 August 2009); doi: 10.1117/12.834888

Published in SPIE Proceedings Vol. 7384:
International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Imaging Detectors and Applications
Kun Zhang; Xiang-jun Wang; Guang-jun Zhang; Ke-cong Ai, Editor(s)