Share Email Print
cover

Proceedings Paper

A point-pattern matching method based on maximal subset of one-to-one mapping
Author(s): Jing Hu; Tian-Xu Zhang
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

This paper presents a new affine registration approach for planar point pattern matching. A process of parameter space clustering is implemented to confirm a one-to-one mapping between the maximal subsets of feature point sets in images. For a best performance, a coarse parameter space and a fine parameter space are used for vectors comparison. Experiments show that the method can produce positive results from a small number of feature points and intensive noise.

Paper Details

Date Published: 30 October 2009
PDF: 7 pages
Proc. SPIE 7496, MIPPR 2009: Pattern Recognition and Computer Vision, 74960C (30 October 2009); doi: 10.1117/12.832468
Show Author Affiliations
Jing Hu, Huazhong Univ. of Science and Technology (China)
Tian-Xu Zhang, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 7496:
MIPPR 2009: Pattern Recognition and Computer Vision
Mingyue Ding; Bir Bhanu; Friedrich M. Wahl; Jonathan Roberts, Editor(s)

© SPIE. Terms of Use
Back to Top