
Proceedings Paper
SWS grating for UV band filter by nano-imprintFormat | Member Price | Non-Member Price |
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Paper Abstract
Regarding to researches on manufacturing process, the fabrication of nano structures on SWS (subwavelength structured)
grating are mainly produced by photo lithography. We find that UV light transmission efficiency of PET film
significantly drops 50% when we put nano structures on the surface of material. In this paper, we add nano structures
on the surface of PET film and create a UV band filter. Decent optical filtering effects can be achieved by combining the
characteristics of PET materials with nano structures on their surfaces.
Paper Details
Date Published: 18 May 2009
PDF: 4 pages
Proc. SPIE 7284, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems, 728416 (18 May 2009); doi: 10.1117/12.832101
Published in SPIE Proceedings Vol. 7284:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems
Sen Han; Masaomi Kameyama; Xiangang Luo, Editor(s)
PDF: 4 pages
Proc. SPIE 7284, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems, 728416 (18 May 2009); doi: 10.1117/12.832101
Show Author Affiliations
Jian-Shian Lin, Industrial Technology Research Institute (Taiwan)
Ke-Hao Liao, Industrial Technology Research Institute (Taiwan)
Chang-Tai Chen, Yuan Ze Univ. (Taiwan)
Ke-Hao Liao, Industrial Technology Research Institute (Taiwan)
Chang-Tai Chen, Yuan Ze Univ. (Taiwan)
Chieh-Lung Lai, Industrial Technology Research Institute (Taiwan)
Cheng-Hao Ko, Yuan Ze Univ. (Taiwan)
Cheng-Hao Ko, Yuan Ze Univ. (Taiwan)
Published in SPIE Proceedings Vol. 7284:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems
Sen Han; Masaomi Kameyama; Xiangang Luo, Editor(s)
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