Proceedings Paper
Numerical simulations of volume holographic imaging system resolution characteristics| Format | Member Price | Non-Member Price |
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Paper Abstract
Because of the Bragg selectivity of volume holographic gratings, it helps VHI system to optically segment the object
space. In this paper, properties of point-source diffraction imaging in terms of the point-spread function (PSF) are
investigated, and characteristics of depth and lateral resolutions in a VHI system is numerically simulated. The results
show that the observed diffracted field obviously changes with the displacement in the z direction, and is nearly
unchanged with displacement in the x and y directions. The dependence of the diffracted imaging field on the
z-displacement provides a way to possess 3-D image by VHI.
Paper Details
Date Published: 18 May 2009
PDF: 5 pages
Proc. SPIE 7284, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems, 72840T (18 May 2009); doi: 10.1117/12.832088
Published in SPIE Proceedings Vol. 7284:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems
Sen Han; Masaomi Kameyama; Xiangang Luo, Editor(s)
PDF: 5 pages
Proc. SPIE 7284, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems, 72840T (18 May 2009); doi: 10.1117/12.832088
Show Author Affiliations
Yajun Sun, Beijing Univ. of Technology (China)
Zhuqing Jiang, Beijing Univ. of Technology (China)
Zhuqing Jiang, Beijing Univ. of Technology (China)
Shaojie Liu, Beijing Univ. of Technology (China)
Shiquan Tao, Beijing Univ. of Technology (China)
Shiquan Tao, Beijing Univ. of Technology (China)
Published in SPIE Proceedings Vol. 7284:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems
Sen Han; Masaomi Kameyama; Xiangang Luo, Editor(s)
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