Proceedings Paper
Angle-resolved ellipsometric data for selective imaging in scattering media| Format | Member Price | Non-Member Price |
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Paper Abstract
Angle-resolved ellipsometric data are recorded on light scattering and provide a real time process for selective imaging
in scattering media. Surface and bulk effects are separated and could be used for a selective screening inside the tissues.
Paper Details
Date Published: 9 July 2009
PDF: 8 pages
Proc. SPIE 7369, Diffuse Optical Imaging II, 736910 (9 July 2009); doi: 10.1117/12.831692
Published in SPIE Proceedings Vol. 7369:
Diffuse Optical Imaging II
Rinaldo Cubeddu; Andreas H. Hielscher, Editor(s)
PDF: 8 pages
Proc. SPIE 7369, Diffuse Optical Imaging II, 736910 (9 July 2009); doi: 10.1117/12.831692
Show Author Affiliations
C. Amra, Institut Fresnel, CNRS, Aix-Marseille Univ. (France)
J. Sorrentini, Institut Fresnel, CNRS, Aix-Marseille Univ. (France)
L. Arnaud, Institut Fresnel, CNRS, Aix-Marseille Univ. (France)
M. Zerrad, Institut Fresnel, CNRS, Aix-Marseille Univ. (France)
P. Tchamitchian, LATP, CNRS, Aix-Marseille Univ. (France)
A. da Silva, Institut Fresnel, CNRS, Aix-Marseille Univ. (France)
J. Sorrentini, Institut Fresnel, CNRS, Aix-Marseille Univ. (France)
L. Arnaud, Institut Fresnel, CNRS, Aix-Marseille Univ. (France)
M. Zerrad, Institut Fresnel, CNRS, Aix-Marseille Univ. (France)
P. Tchamitchian, LATP, CNRS, Aix-Marseille Univ. (France)
A. da Silva, Institut Fresnel, CNRS, Aix-Marseille Univ. (France)
G. Georges, Institut Fresnel, CNRS, Aix-Marseille Univ. (France)
L. Siozade, Institut Fresnel, CNRS, Aix-Marseille Univ. (France)
C. Deumié, Institut Fresnel, CNRS, Aix-Marseille Univ. (France)
P Léon, IFREMER (France)
C. Levêque, IFREMER (France)
F. Chazallet, Shakti (France)
L. Siozade, Institut Fresnel, CNRS, Aix-Marseille Univ. (France)
C. Deumié, Institut Fresnel, CNRS, Aix-Marseille Univ. (France)
P Léon, IFREMER (France)
C. Levêque, IFREMER (France)
F. Chazallet, Shakti (France)
Published in SPIE Proceedings Vol. 7369:
Diffuse Optical Imaging II
Rinaldo Cubeddu; Andreas H. Hielscher, Editor(s)
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