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Proceedings Paper

Vector analysis of the characteristics of diffractive microlens having common focus for a number of wavelengths
Author(s): Yuling Liu; Chenghua Sui; Pinggen Cai
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Paper Abstract

Not only harmonic diffractive microlens has a common focus for a number of discrete wavelengths, but also the ordinary diffractive microlens which is modulo 2π has a common focus for a series of discrete wavelengths, the essence reason of this phenomena is the same, such wavelengths with common focus are called harmonic wavelengths. A number of focuses are generated when monochromatic light wave illuminates an ordinary diffractive microlens. The different focus corresponds to different diffractive order. A series of harmonic wavelengths are focalized by a diffractive microlens at a common focus corresponding to their own diffractive orders. One can design achromatic aberration microlens by using the above characteristic of diffractive microlens. In this paper the diffractive microlens design method and the formula of focallength for various diffractive orders are accounted for. A multilevel diffractive microlens is analyzed by using finite-difference time-domain (FDTD) method. Two-dimensional electric field amplitude distributions for different incident harmonic wavelength are given. The electric field along optical axis for the harmonic wavelengths is plotted at the same time. The results show that the harmonic wavelengths can have common focus. Furthermore, the shorter harmonic wavelength has higher resolution, shorter focal depth, and more focuses than the longer ones.

Paper Details

Date Published: 20 May 2009
PDF: 8 pages
Proc. SPIE 7282, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 72821M (20 May 2009); doi: 10.1117/12.830880
Show Author Affiliations
Yuling Liu, Zhejiang Univ. of Technology (China)
Chenghua Sui, Zhejiang Univ. of Technology (China)
Pinggen Cai, Zhejiang Univ. of Technology (China)

Published in SPIE Proceedings Vol. 7282:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; John M. Schoen; Yoshiharu Namba; Shengyi Li, Editor(s)

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