
Proceedings Paper
Nondestructive terahertz imaging for aerospace applicationsFormat | Member Price | Non-Member Price |
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Paper Abstract
The full potential of terahertz imaging systems for nondestructive aerospace imaging applications has not been realized
due to the lack of data linking damage and defects to terahertz signatures coupled with the complexity of modeling the
signatures. Terahertz systems (0.1 - 2.0 THz) may be ideally suited for NDI applications because of the ability of THz
radiation to penetrate through substances commonly found on the surfaces of aircraft structures while maintaining the
optical resolution required to detect defects. We will discuss several systems that we have used to study the signatures of
a set of target samples with known defects.
Paper Details
Date Published: 24 September 2009
PDF: 9 pages
Proc. SPIE 7485, Millimetre Wave and Terahertz Sensors and Technology II, 74850D (24 September 2009); doi: 10.1117/12.830540
Published in SPIE Proceedings Vol. 7485:
Millimetre Wave and Terahertz Sensors and Technology II
Keith A. Krapels; Neil A. Salmon, Editor(s)
PDF: 9 pages
Proc. SPIE 7485, Millimetre Wave and Terahertz Sensors and Technology II, 74850D (24 September 2009); doi: 10.1117/12.830540
Show Author Affiliations
Douglas T. Petkie, Wright State Univ. (United States)
Izaak V. Kemp, Wright State Univ. (United States)
Carla Benton, Wright State Univ. (United States)
Christopher Boyer, Wright State Univ. (United States)
Izaak V. Kemp, Wright State Univ. (United States)
Carla Benton, Wright State Univ. (United States)
Christopher Boyer, Wright State Univ. (United States)
Lindsay Owens, Wright State Univ. (United States)
Jason A. Deibel, Wright State Univ. (United States)
Christopher D. Stoik, Air Force Institute of Technology (United States)
Matthew J. Bohn, Air Force Institute of Technology (United States)
Jason A. Deibel, Wright State Univ. (United States)
Christopher D. Stoik, Air Force Institute of Technology (United States)
Matthew J. Bohn, Air Force Institute of Technology (United States)
Published in SPIE Proceedings Vol. 7485:
Millimetre Wave and Terahertz Sensors and Technology II
Keith A. Krapels; Neil A. Salmon, Editor(s)
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