
Proceedings Paper
Effect of Te inclusions on internal electric field of CdMnTe gamma-ray detectorFormat | Member Price | Non-Member Price |
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Paper Abstract
We studied two separate as-grown CdMnTe crystals by Infrared (IR) microscopy
and Pockels effect imaging, and then developed an algorithm to analyze and
visualize the electric field within the crystals' bulk. In one of the two crystals the
size and distribution of inclusions within the bulk promised to be more favorable in
terms of efficiency as a detector crystal. However, the Te inclusions were arranged
in characteristic 'planes'. Pockels imaging revealed an accumulation of charges in
the region of these planes. We demonstrated that the planes induced stress within
the bulk of the crystal that accumulated charges, thereby causing non-uniformity of
the internal electric field and degrading the detector's performance.
Paper Details
Date Published: 11 September 2009
PDF: 7 pages
Proc. SPIE 7449, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI, 74491A (11 September 2009); doi: 10.1117/12.830214
Published in SPIE Proceedings Vol. 7449:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI
Ralph B. James; Larry A. Franks; Arnold Burger, Editor(s)
PDF: 7 pages
Proc. SPIE 7449, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI, 74491A (11 September 2009); doi: 10.1117/12.830214
Show Author Affiliations
Oluseyi Stephen Babalola, Vanderbilt Univ. (United States)
Fisk Univ. (United States)
Brookhaven National Lab. (United States)
Aleksey E. Bolotnikov, Brookhaven National Lab. (United States)
Stephen U. Egarievwe, Brookhaven National Lab. (United States)
Fisk Univ. (United States)
Brookhaven National Lab. (United States)
Aleksey E. Bolotnikov, Brookhaven National Lab. (United States)
Stephen U. Egarievwe, Brookhaven National Lab. (United States)
Anwar M. Hossain, Brookhaven National Lab. (United States)
Arnold Burger, Fisk Univ. (United States)
Ralph B. James, Brookhaven National Lab. (United States)
Arnold Burger, Fisk Univ. (United States)
Ralph B. James, Brookhaven National Lab. (United States)
Published in SPIE Proceedings Vol. 7449:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI
Ralph B. James; Larry A. Franks; Arnold Burger, Editor(s)
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