
Proceedings Paper
Flexible radiation dosimeters incorporating semiconducting polymer thick filmsFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
Flexible radiation dosimeters have been produced incorporating thick films (>1 μm) of the semiconducting polymer
poly([9,9-dioctylfluorenyl-2,7-diyl]-co-bithiophene). Diode structures produced on aluminium-metallised poly(imide)
substrates, and with gold top contacts, have been examined with respect to their electrical properties. The results suggest
that a Schottky conduction mechanism occurs in the reverse biased diode, with a barrier to charge injection at the
aluminium electrode. Optical absorption/emission spectra reveal a band gap of 2.48 eV for the polymer. The diodes have
been used for direct charge detection of 17 keV X-rays, generated by a molybdenum source. Using operating voltages of
-10 and -50 V respectively, sensitivities of 54 and 158 nC/mGy/cm3 have been achieved. Increasing the operating
voltage shows that the diodes are stable up to approximately -200 V without significant increase in the dark current of
the device (<0.2 nA).
Paper Details
Date Published: 17 September 2009
PDF: 7 pages
Proc. SPIE 7449, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI, 74491I (17 September 2009); doi: 10.1117/12.829619
Published in SPIE Proceedings Vol. 7449:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI
Ralph B. James; Larry A. Franks; Arnold Burger, Editor(s)
PDF: 7 pages
Proc. SPIE 7449, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI, 74491I (17 September 2009); doi: 10.1117/12.829619
Show Author Affiliations
Christopher A. Mills, Univ. of Surrey (United Kingdom)
Akarin Intaniwet, Univ. of Surrey (United Kingdom)
Maxim Shkunov, Univ. of Surrey (United Kingdom)
Akarin Intaniwet, Univ. of Surrey (United Kingdom)
Maxim Shkunov, Univ. of Surrey (United Kingdom)
Published in SPIE Proceedings Vol. 7449:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI
Ralph B. James; Larry A. Franks; Arnold Burger, Editor(s)
© SPIE. Terms of Use
