
Proceedings Paper
Efficient auto-focus algorithm for optical measurement systemFormat | Member Price | Non-Member Price |
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Paper Abstract
To keep image captured by optical measuring system in focus, pixel-based auto-focusing is a long-standing topic in the
literatures. Sharpness function is the mathematical description of image sharpness. It plays an important role for realizing
robust auto-focusing of optical measuring system. In optical tracking measuring system, the size of moveable object
image always is variational. Under this condition, the existing sharpness functions will not work well for autofocus
system. In this paper, an efficient sharpness function based on the number of variable threshold gradients is proposed.
This auto-focus algorithm calculates the number of gradients bigger than threshold, while threshold is variable according
to image. By using this auto-focus algorithm to optical measuring system, the robust and reliability of autofocus system
are improved. Practical applications illuminate the proposed approach is feasible and effective.
Paper Details
Date Published: 20 May 2009
PDF: 5 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 728344 (20 May 2009); doi: 10.1117/12.828802
Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)
PDF: 5 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 728344 (20 May 2009); doi: 10.1117/12.828802
Show Author Affiliations
Jun Ni, China Jiliang Univ. (China)
Min Wei, Chengdu Univ. of Information Technology (China)
Min Wei, Chengdu Univ. of Information Technology (China)
Jiahu Yuan, Institute of Optics and Electronics (China)
Qinzhang Wu, Institute of Optics and Electronics (China)
Qinzhang Wu, Institute of Optics and Electronics (China)
Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)
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