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Proceedings Paper

Study on interferometry with grating modulating optical fiber interference fringes phase
Author(s): Qiang Dai; Yande Xu; Yijun Liang; Tao Geng; Ronggang Zhu; Wen Li
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Paper Abstract

A novel sinusoidal phase modulating optical fiber interferometers is described. The surface profile of an object can be measured by grating modulating optical fiber interference fringes. The ± first-order beams diffracted by the grating are coupled in two fibers and in optical fiber output two coherent point light source are generated. The two coherent point light sources have the same intensity so as to high contrast interference fringes are got. When piezoelectric ceramic vibrates with the grating, the position of ± first-order beams diffracted by the grating does not change but the phase of optical fiber output field interference fringes change periodic. By using sinusoidal phase modulating method can detect the phase variations of interference fringes and the surface profile of an object can be measured. Detail description about the optical principle, optical path design and phase modulating and demodulation are researched. The experiment shows that this measurement method can overcome fluctuate of light source intensity and wavelengths at the same time have the characteristic of high precision and large non-contact measurement range.

Paper Details

Date Published: 20 May 2009
PDF: 6 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72831C (20 May 2009); doi: 10.1117/12.828784
Show Author Affiliations
Qiang Dai, Harbin Engineering Univ. (China)
Yande Xu, Harbin Engineering Univ. (China)
Yijun Liang, Harbin Engineering Univ. (China)
Tao Geng, Harbin Engineering Univ. (China)
Ronggang Zhu, Harbin Engineering Univ. (China)
Wen Li, Harbin Engineering Univ. (China)


Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)

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