
Proceedings Paper
Application of CCD measurement technique for wear on pantograph sliding platesFormat | Member Price | Non-Member Price |
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Paper Abstract
Pantograph sliding plate is the most important electricity-collecting part in locomotive power supply system. Once the
sliding plates are disabled, they will be severe dangerous for safety. The measurement for pantograph of 27.5KV is
especially difficult. The article uses non-contact and online dynamic detection by utilizing CCD technique to solve the
problem. The system will get all images of sliding plates after triggering by space arrangement of CCD cameras
cooperated with flashlights. The precision of demarcate is guaranteed by special methods. It adopts directional edge
search to get sliding plates, and connect the images of different CCDS. It also makes use of conditional Hough
transformation to locate the wire. The wear on sliding plates will be given after complicated processing. The system is
applicable to the detection for all kinds of pantographs by adding different arithmetic amends. At last the precision can
achieve ±0.5mm . At the same time a database is setup which can give the trend curve of wear, it can predict the limit
time of the sliding plates.
Paper Details
Date Published: 20 May 2009
PDF: 7 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 728334 (20 May 2009); doi: 10.1117/12.828760
Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)
PDF: 7 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 728334 (20 May 2009); doi: 10.1117/12.828760
Show Author Affiliations
Kai Yang, Southwest Jiaotong Univ. (China)
Li Wang, Southwest Jiaotong Univ. (China)
Xiaorong Gao, Southwest Jiaotong Univ. (China)
Li Wang, Southwest Jiaotong Univ. (China)
Xiaorong Gao, Southwest Jiaotong Univ. (China)
Quanke Zhao, Southwest Jiaotong Univ. (China)
Zeyong Wang, Southwest Jiaotong Univ. (China)
Chaoyong Peng, Southwest Jiaotong Univ. (China)
Zeyong Wang, Southwest Jiaotong Univ. (China)
Chaoyong Peng, Southwest Jiaotong Univ. (China)
Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)
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