
Proceedings Paper
Multi-sensor data fusion based on electro-optical tracking systemFormat | Member Price | Non-Member Price |
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Paper Abstract
The modern electro-optical (EO) measurement and tracing system usually has different kind of EO sensors that can get
measurement of the target at the same time. The traditional tracking system of electro-optical measurement device mainly
relies on single sensor that has better precision, and switches to other sensors while tracking is unstable. However, it
brings on unstable tracking performance and dramatic decrease of tracking precision while switching among different
sensors that have different measurement accuracy. To overcome the disadvantage of the conventional tracking method, a
federated Kalman filter algorithm based on multi-sensor fusion of several sensors in EO tracking system is proposed. The
local filters deal with the target track from each sensor, then the synthetic target estimation is made according to the sensor
fusion of local estimation. Then the weight factor is assigned to each local filter using the fuzzy logic technique by
analyzing the covariance of target estimation. The weight factor represents the degree of performance of the local estimation
and shows the relationship between each sensor. The simulations with Monte Carlo methods show that the proposed
algorithm is effective in optoelectronic tracking system especially in the situation of switching among different sensors,
and the precision is also superior to the traditional single sensor tracking algorithm.
Paper Details
Date Published: 20 May 2009
PDF: 6 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72832V (20 May 2009); doi: 10.1117/12.828728
Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)
PDF: 6 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72832V (20 May 2009); doi: 10.1117/12.828728
Show Author Affiliations
Jin Zhang, Institute of Optics and Electronics (China)
Graduate Univ. of the Chinese Academy of Sciences (China)
Yu Lu, Institute of Optics and Electronics (China)
Graduate Univ. of the Chinese Academy of Sciences (China)
Wanping Wang, Graduate Univ. of the Chinese Academy of Sciences (China)
Institute of Optics and Electronics (China)
Graduate Univ. of the Chinese Academy of Sciences (China)
Yu Lu, Institute of Optics and Electronics (China)
Graduate Univ. of the Chinese Academy of Sciences (China)
Wanping Wang, Graduate Univ. of the Chinese Academy of Sciences (China)
Institute of Optics and Electronics (China)
Yong Zhang, Institute of Optics and Electronics (China)
Graduate Univ. of the Chinese Academy of Sciences (China)
Qinzhang Wu, Institute of Optics and Electronics (China)
Graduate Univ. of the Chinese Academy of Sciences (China)
Qinzhang Wu, Institute of Optics and Electronics (China)
Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)
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