Proceedings Paper
Analysis and study of zero displacement quantities of low-level light sight device based on shooting experimental condition| Format | Member Price | Non-Member Price |
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Paper Abstract
In order to solve the problem of zero displacement momentum of Low-level-light (LLL) sight device, it requitres to
provide regulating structure of LLL sight device reticle. Through force analysis of the adjusting screw thread mechanism
of reticle under load conditions in shoot test, especially through the calculation of the accumulating value of the
circumference torque Tz when the equivalent frictional angle ρ changes, it reveals the zero displacement momentum
mechanism of the LLL sight device under the load functions in the shoot test. Applying CMETS005 computer-controlled
mulit-environment test of LLL sight device detection systems of this study for practical test, error precision is less than
0.05 mil and the measuring range is greater than 40 mil, which presents that the testing data are reliable and provide
theoretical analysis basis for the production of other direct vision sight devices.
Paper Details
Date Published: 20 May 2009
PDF: 6 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72832R (20 May 2009); doi: 10.1117/12.828725
Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)
PDF: 6 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72832R (20 May 2009); doi: 10.1117/12.828725
Show Author Affiliations
Youtang Gao, Nanjing Univ. of Science & Technology (China)
NanYang Institute of Technology (China)
Yuan Xu, NanYang Institute of Technology (China)
NanYang Institute of Technology (China)
Yuan Xu, NanYang Institute of Technology (China)
Si Tian, Nanjing Univ. of Science & Technology (China)
NanYang Institute of Technology (China)
Benkang Chang, Nanjing Univ. of Science & Technology (China)
NanYang Institute of Technology (China)
Benkang Chang, Nanjing Univ. of Science & Technology (China)
Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)
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