
Proceedings Paper
Method for recovering dynamic position of photoelectric encoderFormat | Member Price | Non-Member Price |
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Paper Abstract
This paper presents a method to recover dynamic position of photoelectric encoder. While working at dynamic state,
original outputs of the photoelectric encoder are in theory two sine or triangular signals with a phase difference of π/2.
However, there are still deviations of actual output signals. Interpolating on the basis of this deviation signal will result in
interpolation errors. In dynamic state, true original signal data obtained by data acquisition system is a time equation.
Through processing these data by data equiangular and harmonic analysis, the equation will be converted from time
domain to position domain and an original position equation can be formed. Then the interpolation errors also can be
obtained. By this method, the interpolation errors can be checked in dynamic state and it can also provide electric
interpolation basis so that to improve dynamic interpolation precision of the encoder. Software simulation and
experimental analysis all prove the method effective. This method is the basis in theory for precision checking and
calibration in motion.
Paper Details
Date Published: 20 May 2009
PDF: 5 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 728328 (20 May 2009); doi: 10.1117/12.828703
Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)
PDF: 5 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 728328 (20 May 2009); doi: 10.1117/12.828703
Show Author Affiliations
Yong-zhi Wu, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of the Chinese Academy of Sciences (China)
Qiu-hua Wan, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Chang-hai Zhao, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of the Chinese Academy of Sciences (China)
Qiu-hua Wan, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Chang-hai Zhao, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Ying Sun, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of the Chinese Academy of Sciences (China)
Li-hui Liang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of the Chinese Academy of Sciences (China)
Yi-sheng Liu, National Ctr. of Quality Supervision and Inspection of Automobile Spare Parts (China)
Graduate School of the Chinese Academy of Sciences (China)
Li-hui Liang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of the Chinese Academy of Sciences (China)
Yi-sheng Liu, National Ctr. of Quality Supervision and Inspection of Automobile Spare Parts (China)
Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)
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