
Proceedings Paper
Distortion correction of optical system based on neural network and automated generation of reference pointsFormat | Member Price | Non-Member Price |
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Paper Abstract
The distortion can be formed as the magnifying power of image changes in the field of view in a practical optical system
if the field of view is large enough. Optical distortion can be corrected by aberration correction theory, as well as digital
image processing technology. The theory of distortion correction by digital image processing technology is discussed,
the method of getting reference points by lattice templet is introduced, and the method of generating reference points
automatically is proposed. The algorithm based on BP neural network which can approximate any continuous function is
used to get coordinate transform function between ideal image and distorted image. The method of bilinear gray-level
interpolation is adopted because the calculation of bilinear interpolation is less than others as strict requirements on
calculation in engineering application. Finally, a sample of image correction is given, and the results show that it is very
fast and convenient to pick up reference point, and the precision of results is high with the method of neural network.
Paper Details
Date Published: 20 May 2009
PDF: 5 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72831R (20 May 2009); doi: 10.1117/12.828680
Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)
PDF: 5 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72831R (20 May 2009); doi: 10.1117/12.828680
Show Author Affiliations
Qiang Li, Huazhong Univ. of Science and Technology (China)
Wuhan Polytechnic Univ. (China)
Yan-an Zeng, Huazhong Univ. of Science and Technology (China)
Wuhan Polytechnic Univ. (China)
Yan-an Zeng, Huazhong Univ. of Science and Technology (China)
Zhi-xian Jiu, Huazhong Univ. of Science and Technology (China)
Kun-tao Yang, Huazhong Univ. of Science and Technology (China)
Kun-tao Yang, Huazhong Univ. of Science and Technology (China)
Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)
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