
Proceedings Paper
Dynamic detection technology for the irregularity state of railway track based on linear array CCDFormat | Member Price | Non-Member Price |
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Paper Abstract
A dynamic detection technology for the irregularity state of railway track by means of linear array CCD sensor is
introduced, and the detecting method, the structure of the system are also described in detail. In this paper, a model of
2-meter chord measuring method is established; the digital inverse filter is analyzed and simulated to get the irregularity
state of railway track. The analysis and Summary about how to apply the inverse filter are given. Finally some
experiment result and detection data are given from the depot.
Paper Details
Date Published: 20 May 2009
PDF: 5 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 728313 (20 May 2009); doi: 10.1117/12.828630
Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)
PDF: 5 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 728313 (20 May 2009); doi: 10.1117/12.828630
Show Author Affiliations
Jian-ping Peng, Southwest Jiaotong Univ. (China)
Li Wang, Southwest Jiaotong Univ. (China)
Xiao-rong Gao, Southwest Jiaotong Univ. (China)
Li Wang, Southwest Jiaotong Univ. (China)
Xiao-rong Gao, Southwest Jiaotong Univ. (China)
Ze-yong Wang, Southwest Jiaotong Univ. (China)
Quan-ke Zhao, Southwest Jiaotong Univ. (China)
Quan-ke Zhao, Southwest Jiaotong Univ. (China)
Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)
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