
Proceedings Paper
Study on portable optical 3D coordinate measuring systemFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
A portable optical 3D coordinate measuring system based on digital Close Range Photogrammetry (CRP) technology
and binocular stereo vision theory is researched. Three ultra-red LED with high stability is set on a hand-hold target to
provide measuring feature and establish target coordinate system. Ray intersection based field directional calibrating is
done for the intersectant binocular measurement system composed of two cameras by a reference ruler. The hand-hold
target controlled by Bluetooth wireless communication is free moved to implement contact measurement. The position of
ceramic contact ball is pre-calibrated accurately. The coordinates of target feature points are obtained by binocular stereo
vision model from the stereo images pair taken by cameras. Combining radius compensation for contact ball and residual
error correction, object point can be resolved by transfer of axes using target coordinate system as intermediary. This
system is suitable for on-field large-scale measurement because of its excellent portability, high precision, wide
measuring volume, great adaptability and satisfying automatization. It is tested that the measuring precision is near to
±0.1mm/m.
Paper Details
Date Published: 20 May 2009
PDF: 5 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 728311 (20 May 2009); doi: 10.1117/12.828628
Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)
PDF: 5 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 728311 (20 May 2009); doi: 10.1117/12.828628
Show Author Affiliations
Tongqun Ren, Xiamen Univ. (China)
Jigui Zhu, Tianjin Univ. (China)
Jigui Zhu, Tianjin Univ. (China)
Yinbiao Guo, Xiamen Univ. (China)
Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)
© SPIE. Terms of Use
