
Proceedings Paper
Effect of threshold value on high reflectivity measurement with optical feedback cavity ring-down techniqueFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
The influence of a predefined threshold value on high reflectivity measurement in an optical feedback cavity ring-down
technique (OF-CRD) is investigated. The strong optical feedback from the front cavity mirror of a linear ring-down
cavity is re-injected into the oscillator cavity of the diode laser and causes line-width reduction of diode laser. The
narrowed laser line is occasionally in resonance with one or more ring-down cavity modes and large resonant peaks are
observed in the ring-down cavity output signals. The diode laser is switched off at the negative step of the square-wave
modulation signal. If the amplitude at the negative step exceeds the pre-defined threshold value, an exponential decay
signal is recorded to fit the cavity decay time. The reflectivity of the cavity mirror is determined statistically to be
99.9907±0.0002% and 99.9899±0.0004% with threshold values of 350mV and 50mV, respectively. All reflectivities
measured at six cavity lengths with a higher threshold are more precise than that measured with the lower threshold. A
method to determine the threshold value is proposed for accurate high reflectivity measurement.
Paper Details
Date Published: 20 May 2009
PDF: 6 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72830U (20 May 2009); doi: 10.1117/12.828618
Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)
PDF: 6 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72830U (20 May 2009); doi: 10.1117/12.828618
Show Author Affiliations
Yuan Gong, Institute of Optics and Electronics (China)
Graduate School of the Chinese Academy of Sciences (China)
Yanling Han, Institute of Optics and Electronics (China)
Graduate School of the Chinese Academy of Sciences (China)
Yanling Han, Institute of Optics and Electronics (China)
Bincheng Li, Institute of Optics and Electronics (China)
Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)
© SPIE. Terms of Use
