
Proceedings Paper
Performance analysis of temperature and strain simultaneous measurement system based on coherent detection of Brillouin scatteringFormat | Member Price | Non-Member Price |
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Paper Abstract
A microwave coherent detection system is presented which can be used to simultaneously measure the temperature and
strain distribution along a fiber with high accuracy based on spontaneous Brillouin scattering. The system measures the
Brillouin scattering and Rayleigh scattering in fiber simultaneously, using the ratio of the Rayleigh and spontaneous
Brillouin backscattered light called Landau-Placzek Ratio (LPR), and scans the Brillouin spectrum to obtain the desired
information. The measurement system setup is showed in this paper, and the system performances such as the spatial
resolution, the spectrum, the measurement accuracy, the dynamic range, and the measurement time are analyzed. The
analysis shows that the system can achieve the spatial resolution of 2m, temperature resolution of 1 and strain
resolution of 20με.
Paper Details
Date Published: 20 May 2009
PDF: 7 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72830T (20 May 2009); doi: 10.1117/12.828617
Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)
PDF: 7 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72830T (20 May 2009); doi: 10.1117/12.828617
Show Author Affiliations
LiJuan Zhao, North China Electric Power Univ. (China)
YongQian Li, North China Electric Power Univ. (China)
YongQian Li, North China Electric Power Univ. (China)
JiSheng Zhang, North China Electric Power Univ. (China)
Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)
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