
Proceedings Paper
Development of real-time photoelectric measurement on geometric size of objectsFormat | Member Price | Non-Member Price |
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Paper Abstract
The characteristic and work principium of Charge Coupled Devices (CCD) is expatiated. Based on CCD
measuring technology, a geometric objects photoelectric comprehensive measuring system is described in the paper,
which is applied to measure the thickness of quartz tube wall non-contacted automatically with a line CCD device. The
system is composed of a semiconductor laser source, a main fine mechanic system and controller, a real-time controlling
system with SCM and data processing system by PC. The optics system, CCD hardware circuit and SCM control system
are mainly discussed in this system. The system work process: optics, machine, electron and computer are organically
combined, the line CCD in this instrument can measure the distance between two laser beams which are reflected from
the outside and inside surfaces of quartz tube wall. Comparisons between the system and traditional measurement
instrument are provided with: high measurement precision and efficiency; celerity and real time. In addition,
applications of the system are viewed in the geometric objects foot-line real-time detection of the tube wall thickness
and plank thickness, and medicine and liquor manufacturing, and the system error is analyzed.
Paper Details
Date Published: 20 May 2009
PDF: 5 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72830Q (20 May 2009); doi: 10.1117/12.828612
Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)
PDF: 5 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72830Q (20 May 2009); doi: 10.1117/12.828612
Show Author Affiliations
Guangming Yuan, Shandong Univ. of Technology (China)
Tianze Li, Shandong Univ. of Technology (China)
Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)
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