
Proceedings Paper
Tracking and detecting occupational diseases for teachers with infrared imaging methodFormat | Member Price | Non-Member Price |
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Paper Abstract
Most academic teachers are chairborne and often revise the exercises for students for a long time, so they often have
some occupational diseases, such as sciatica, vertebral ache, and so on. Some early diseases are so difficult to be detected
that the patients lose the better curable time. The infrared imaging is a non-touch and harmless method and it is efficient
in prophylactic iatrology. The paper introduces a method to track and detect the occupational diseases for academic
teachers. The infrared pictures of the same position for the same person are collected at the different period. The position
is one of the usually parts of the teacher's occupational diseases, such as the neck, the shoulder, the back, the wrist, and
so on. For each position of a certain person, the infrared pictures are collected and saved at different period. The period
may be 6 month or one year. Infrared pictures are collected by the infrared imaging device, and a database of the infrared
pictures is established. According to the difference of the infrared pictures of the same position at different period, the
latent disease part may be found out and the ailing degree can be detected.
Paper Details
Date Published: 20 May 2009
PDF: 4 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72830C (20 May 2009); doi: 10.1117/12.828594
Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)
PDF: 4 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72830C (20 May 2009); doi: 10.1117/12.828594
Show Author Affiliations
Shu-wang Chen, Hebei Univ. of Science & Technology (China)
Sheng-biao An, Hebei Univ. of Science & Technology (China)
Sheng-biao An, Hebei Univ. of Science & Technology (China)
Shu-hai Wang, Hebei Univ. of Science & Technology (China)
Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)
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