
Proceedings Paper
Optical requirements with turbulence correction for long-range biometricsFormat | Member Price | Non-Member Price |
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Paper Abstract
Iris recognition utilizes distinct patterns found in the human iris to perform identification. Image acquisition is a critical
first step towards successful operation of iris recognition systems. However, the quality of iris images required by
standard iris recognition algorithms puts hard constraints on the imaging optical systems which have resulted in
demonstrated systems to date requiring a relatively short subject stand-off distance. In this paper, we study long-range
iris recognition at distances as large as 200 meters, and determine conditions the imaging system must satisfy for
identification at longer stand-off distances.
Paper Details
Date Published: 5 May 2009
PDF: 11 pages
Proc. SPIE 7306, Optics and Photonics in Global Homeland Security V and Biometric Technology for Human Identification VI, 730622 (5 May 2009); doi: 10.1117/12.828558
Published in SPIE Proceedings Vol. 7306:
Optics and Photonics in Global Homeland Security V and Biometric Technology for Human Identification VI
B.V.K. Vijaya Kumar; Craig S. Halvorson; Šárka O. Southern; Salil Prabhakar; Arun A. Ross, Editor(s)
PDF: 11 pages
Proc. SPIE 7306, Optics and Photonics in Global Homeland Security V and Biometric Technology for Human Identification VI, 730622 (5 May 2009); doi: 10.1117/12.828558
Show Author Affiliations
Junoh Choi, Sandia National Labs. (United States)
Grant H. Soehnel, Sandia National Labs. (United States)
Brett E. Bagwell, Sandia National Labs. (United States)
Grant H. Soehnel, Sandia National Labs. (United States)
Brett E. Bagwell, Sandia National Labs. (United States)
Kevin R. Dixon, Sandia National Labs. (United States)
David V. Wick, Sandia National Labs. (United States)
David V. Wick, Sandia National Labs. (United States)
Published in SPIE Proceedings Vol. 7306:
Optics and Photonics in Global Homeland Security V and Biometric Technology for Human Identification VI
B.V.K. Vijaya Kumar; Craig S. Halvorson; Šárka O. Southern; Salil Prabhakar; Arun A. Ross, Editor(s)
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